A new transmittance measurement setup, based on the use of a tunable laser source and a low-noise scientific-grade CCD camera operating in perfect integration mode, is proposed to achieve the spectrally resolved characterization of thin-film filters with optical densities from 0 to 12 in a wavelength range between 400 and 1000 nm. The first experimental results obtained on dedicated components demonstrate the efficiency of this new measurement scheme.
Articles scientifiques
Broadband Spectral Transmittance Measurements of Complex Thin-Film Filters With Optical Densities of Up to 12
Année
2015
Produits associés
Résumé
Simona Liukaityte, Michel Lequime, Myriam Zerrad, Thomas Begou, and Claude Amra
